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- 2017-08-16 发布于安徽
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200083
The stress analysis of basis of HgCdTe photovoltage detector
at low temperature
LIAO Qingjun ZHANG Qinyao XU Miaogen HU Xiaoning
ShangHai Institute of Technical Physics Chinese Academy of Science
Abstract: The paper presents the measurement of the stess result of the HgCdTe PV dtectors basis
while changing the temperature,abtains the relationship between
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