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2011-05-24 Antares customer presentation
1? 2010, Intego GmbH Version 2.0
Thomas Wagner Only for confidential use at customers
Thomas Wagner
Intego GmbH
Henri-Dunant-Str. 8
D-91058 Erlangen
+49-9131-61082-150
thomas.wagner@intego.de
ANTARES
Crack detection for wafers and cells
2? 2010, Intego GmbH Version 2.0
Thomas Wagner Only for confidential use at customers
ANTARES Wafer Cell
Inline system for contactless crack detection
Inline system
? Reliable crack detection tool
? Works contactless
? Single wafers/cells are inspected on-the-fly
? For integration into existing production
lines above the conveyor belt
? Optionally with bottom section and
conveyor belts
Inline system for
integration above
conveyor belts
3? 2010, Intego GmbH Version 2.0
Thomas Wagner Only for confidential use at customers
ANTARES Wafer
Example of a microcrack in a wafer
The microcrack is clearly visible ensuring an
easy and reliable automatic detection
Comparison: Detail of the microcrack of the ANTARES Wafer
with the conventional IR crack detection (where the crack is
not so clearly visible, even for the human eye, and therefore
hard to detect in an automatic evaluation)
ANTARES Wafer Conventional crack detection
ANTARES Wafer: Complete wafer
Mikrocrack details
4? 2010, Intego GmbH Version 2.0
Thomas Wagner Only for confidential use at customers
ANTARES Wafer Cell
Example of cracks in a wafer and a cell
Detected crack in a multicrystalline wafer (length approx. 3mm) Detected crack in a multicrystalline cell (length approx. 6mm)
5? 2010, Intego GmbH Version 2.0
Thomas Wagner Only for confidential use at customers
ANTARES Wafer Cell
Key features
Inline
Contact-free infrared microcrack inspection for
wafers and cells
Robust reliable
Not disturbed by any grain structure or backfield
metallization
Quick
Cycle time: 1 sec. per wafer, 2 sec. per cell
6? 2010, Intego GmbH Version 2.0
Thomas Wagner Only for confidential use at customers
ANTARES Cell
Example of small cracks in cells
Here are some examples of smal
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