SoC测试访问机制和测试壳的蚁群联合优化.pdfVIP

Vo l. 21. No.4 计算机辅助设计均阁形学学报 第 21 卷第4 朔 2009 年 4 月 JOURNAL OF COMPUTER-A lDED DESIGN ßιCOMPUTER GRAPHICS Apr. • 2009 SoC 测试访问机制和测试壳的蚁群联合优化 在小乐 程伟 {北京大学深圳研究生院集成微系统科学工程均应用重点实验室 糠圳 518055) (squall-418@163.com) 摘 要 针对系统级芯片(SoC) 测试壳优化和测试访问机制的测试总线划分问题，提出了基于蚁群算法的SoC Wrapper/TAM 联合优化方法.构造蚁群算法时首先进行 IP 核的测试壳优化，用于缩短最长扫描链长度，减少单个 IP 核的测试时间;在此基础上进行丁AM 结构的蚁群优化.通过算法迭代逼近测试总线的最优划分，从而缩短SoC 测试时间.对 ITC2002 基准SoC 电路进行实验的结果表明，该方法能有效地解决SoC 测试优化问题， 关键词 测试亮;蚁群算法g 测试访问机制;系统芯片 中图法分类号 TN47 Test Wrapper and Test Access Mechanism Co-optimization for SoC ßased on Ant Colony Algorithm Cuî Xîaole Cheng Wei (The Key Laboratory 01 Integrated Microsystems. Shen :r:hen Graduate School 01 Peking University. Shenzhen 518055) Abstract To cope with the problem of test wrapper/TAM co-optimization of SoC , this paper proposes an ant colony algorithm as an optimization scheme. The research work includes two steps. Firstly , an ant colony optimization (ACO) algorithm for IP test wrapper is designed to shorten the length of the longest scan chain in the SoC chip and decrease the test time for single IPs. Based on the look up table acquired from the first step , ACO algorithm is applied in test wrapper/TAM co-optimization problem to decrease the test time for the entire SoC chip by approximating to the optimal result on test bus division. Experimental results on ITC02 benchmark circuits proved the effectiveness of the scheme. Key words test wrapper; ant colony algorithm; test access mechanism; system-on叩hip 为布般地解决 Wrapper/TAM 的联合优化，按 现代 SoC 中不同 IP 核对数据端口的需求各布 不同，在片上测试访问机制(test access mechanism , 照复杂度的不同，Iyengar 等将这种组合优化问题划 TAM)宽度有限的情况下，对各个 IP 核进行测试变