L3国际合作实验-ILCAgenda.ppt

ILC 2005, Vienna UM - FSI for ILC Tracker Alignment FSI Demonstration System Frequency Scanned Interferometerfor ILC Tracker Alignment Hai-Jun Yang, Sven Nyberg, Keith Riles University of Michigan, Ann Arbor International Linear Collider Workshop Vienna, November 14-17, 2005 ILC - Silicon Detector ? Barrel – 5 layers, inner/outer radii – 20/125 cm, Silicon drift detector or microstrips ?r? = 10 ?m, ?rz = 20 ?m ? Forward – 5 disks, double-sided silicon microstrips ?r? = 7 ?m, ?rz = 7 ?m ? High precision alignment needed. ? Coverage - |cos(?)|=0.99 ? Boundary between barrel and forward disks - |cos(?)|=0.80 ? Wafer size – 10cm x 10cm ? Wafer thickness – 150 ?m A Possible SiD Tracker Alignment Physics Goals and Background Principle of Distance Measurement The measured distance can be expressed by + constant end corrections c - speed of light, ?N – No. of fringes, ?? - scanned frequency ng – average refractive index of ambient atmosphere Assuming the error of refractive index is small, the measured precision is given by: (?R / R)2 = (??N / ?N)2 + (??v / ??)2 Example: R = 1.0 m, ?? = 6.6 THz, ?N ~ 2R??/c = 44000 To obtain ?R ? 1.0 ?m, Requirements: ??N ~ 0.02, ??v ~ 3 MHz FSI Demonstration System (I) FSI Demonstration System (I) FSI with Optical Fibers (II) Two Multiple-Measurement Techniques Vibration Measurement Vibration Measurement * Controlled vibration source with very low amplitude fvib = 1.01 ? 0.01 Hz, ampvib = 9.5 ? 1.5 nanometers * Measured vibration fvib = 1.025 ? 0.002 Hz, ampvib = 9.3 ? 0.3 nanometers ?Measurable range fvib = 0.1 ~ 100 Hz, ampvib = few nm ~ 0.4 ?m Absolute Distance Measurements Absolute Distance Measurements FSI Performance - Published Results Dual-Laser FSI (III) Fringes & F-P Peaks (dual-laser) Fringe Interpolating Technique Distance Measurement Precision Dual-Laser FSI Data Samples – Under Realistic Conditions * 10 sequential scans with box open,