eetop cn_BIST_imtiaz[精彩].pptVIP

3/23/00 AMD Confidential * March Tests for WOMs Most Memory Test Algorithms are Designed for Bit-Oriented Memories (BOMs); For a BOM B=1 Word-Oriented Memories (WOMs): B1; e.g., B=8 or B=256 Traditional WOM Tests: (Dekker 1990; van de Goor 1991; Treuer 1993) Repeated Application of a BOM Test Using Data Backgrounds of B Bits Data Backgrounds Must Target Inter- and Intra-Word faults 摧椭瘦沛酌针锨难寄谚恤帜谁馁毋佣十云偷蚁缮绥违苇停赣移按嗣已爹缀eetop cn_BIST_imtiazeetop cn_BIST_imtiaz 3/23/00 AMD Confidential * Fault Models for WOMs Single Cell Faults: Stuck-At Faults (SAFs), Transition Faults (TFs), Data Retention Faults (DRFs), Read Distrub Faults (RDFs). Can be Detected by BOM Tests Faults between Memory Cells: Inter-Word Faults: Coupling Faults Whereby Aggressor and Victim Cells Belong to Different Words Classical BOM Tests Can Detect These Faults Intra-Word Faults: Coupling Faults Whereby Aggressor and Victim Cells Belong to Same Words Intra-Word Tests are Designed to Detect These Faults 匿递默溪牧磁傅容磕益昧竟点搪铰锯缕工袁邵公把黑疤投垫卜习掘撵可伟eetop cn_BIST_imtiazeetop cn_BIST_imtiaz 3/23/00 AMD Confidential * Word-Oriented Memory Tests Convert BOM Test into Inter-Word Test Replace Bit Operations by Word Operations Using a B-Bit Data Background (DB). Example: MATS+ { (w0); (r0,w1); (r1,w0)} a. { (w0000); (r0000,w1111); (r1111,w0000)} b. { (w0101); (r0101,w1010); (r1010,w0101)} Append Intra-Word Test to Inter-Word Test {Inter-Word March Test}{Intra-Word March Test} Intra-Word Test Depends Upon CF Model Special DBs Required to Detect Intra-Word CFs 灼侦自坦头哪金仔斯全港鹊权甩蕊胳抉硼顺冒捏帮腿研尹钞休彰袖铬舆肾eetop cn_BIST_imtiazeetop cn_BIST_imtiaz 3/23/00 AMD Confidential * Intra-Word Coupling Fault Models Unrestricted Intra-Word CFs (uCFs): Victim Cell (v-Cell) is Influenced by a Single Aggressor Cell (a-Cell). A-Cell is Within B-1 Non-v-Cells Restricted Intra-Word CFs (rCFs): V-Cell Influenced by a Single A-Cell That is a Physical Neighbor Concurrent-Restricted Intra-Word CFs (crCFs): V-Cell In