band excitation英文电子资料.pdf

Home Search Collections Journals About Contact us My IOPscience The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale This article has been downloaded from IOPscience. Please scroll down to see the full text article. 2007 Nanotechnology 18 435503 (/0957-4484/18/43/435503) View the table of contents for this issue, or go to the journal homepage for more Download details: IP Address: 6 The article was downloaded on 19/08/2012 at 14:59 Please note that terms and conditions apply. IOP PUBLISHING NANOTECHNOLOGY Nanotechnology 18 (2007) 435503 (8pp) doi:10.1088/0957-4484/18/43/435503 The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale 1 1,2,4 3 Stephen Jesse , Sergei V Kalinin , Roger Proksch , A P Baddorf1,2 and B J Rodriguez1,2 1 Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA 2 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA 3 Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, USA E-mail: sergei2@ Received 6 June 2007, in final form 30 July 2007 Published 19 September 2007 Online at /Nano/18/435503 Abstract Mapping energy transformation pathways and dissipation on the nanoscale and understanding the role of local structure in dissipative behavior is a key challenge for imaging in areas ranging from electronics and information technologies to efficient energy production. Here we develop a family of novel scanning probe microscopy (SPM) techniques in