基于图顶点染色的并行测试自动调度算法-电子与通信工程专业论文.docxVIP

I I 基于图顶点染色的并行测试自动调度算法 摘 要 摘 要 目前电子制造业的产品自动测试系统大多采用顺序多工位的测试方式，仪器设 备利用率低，并且操作人员需求数量多，故生产测试成本高昂。本文针对此问题， 引入了并行测试的改造方案，构建了多 DUT(Device Under Test)交错测试系统，重 点对系统中的自动调度算法问题进行了深入研究。 针对要解决的工程实际问题，本文首先构建了 TCG(Testing Conflict Graph) 和 PTG(Parallel Testing Graph)图的概念，将实际要解决的工程问题转化为图论 中的顶点染色问题。然后在此理论基础上通过构建特例的方法，提出了可以在多项 式时间内获得最优解的静态测试调度算法和多 DUT 测试任务随机分配的动态测试调 度算法。最后基于 LabVIEW 平台，完成了算法的程序开发和性能测试仿真。仿真结 果表明：当 PTG 为 Petersen 图时，与传统顺序测试方式相比，测试系统在单个 DUT 测试的情况下效率提升达 72.52%，在 8 个 DUT 同时测试的情况下效率提升不低于 67.76%。 关键词 顺序测试 并行测试 图顶点染色 静态测试调度 动态测试调度 作 者：王利生 指导老师：邵卫东 II II Abstract 基于图顶点染色的并行测试自动调度算法 Abstract Sequential multi-station test is mostly used in the automatic test system for electronic manufacturing now, but the cost is high because of the low utilization rate of equipment and manpower. A multiple DUT alternate parallel testing scheme is introduced to improve it, so automatic testing scheduling algorithm study and develop is major task in this paper. TCG and PTG are presented firstly to transform testing scheduling problem into mathematics problems about graph vertex coloring theory. Following a static testing scheduling algorithm is proposed to obtain the optimal solution in polynomial time by the method of constructing a special case, and then a dynamic testing scheduling algorithm based on the tasks assigned randomly is presented for actual parallel testing system using. Finally software development and test simulation according with two algorithms are finished by LabVIEW. Simulation results show that efficiency is up to 72.52% for single DUT testing and not less than 67.76% for eight DUTs testing simultaneously, compared with traditional sequential test, when the PTG is Petersen graph. Keywords Sequential Testing, Parallel testing, Graph vertex coloring, Static testing scheduling, Dynamic testing scheduling Written by Wang Lisheng Supervised by Shao Weidong 目 录 HYPERLINK \l _bookmark0 1 序言1 HYPERLINK \l _bookmark1 1.1 本文研究的目的和意义1 HYPERLINK \l _bookmark2 1.2 自动测试的发展和现状