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IEEE TRANSACTIONS ON RELIABILITY, VOL. 58, NO. 4, DECEMBER 2009 611 Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes Sheng-Tsaing Tseng, Member, IEEE, Narayanaswamy Balakrishnan, and Chih-Chun Tsai Abstract—Step-stress accelerated degradation testing (SSADT is a useful tool for assessing the lifetime distribution of highly reliable products (under a typical-use condition when the available test items are very few. Recently, an optimal SSADT plan was proposed based on the assumption that the underlying degradation path follows a Wiener process. However, the degradation model of many materials (especially in the case of fatigue data may be more appropriately modeled by a gamma process which exhibits a monotone increasing pattern. Hence, in practice, designing an ef?cient SSADT plan for a gamma degradation process is of great interest. In this paper, we ?rst introduce the SSADT model when the degradation path follows a gamma process. Next, under the constraint that the total experimental cost does not exceed a pre-speci?ed budget, the optimal settings such as sample size, measurement frequency, and termination time are obtained by minimizing the approximate variance of the estimated MTTF of the lifetime distribution of the product. Finally, an example is presented to illustrate the proposed method. Index Terms—Gamma process, optimal design, step-stress accelerated degradation tests, total experimental cost, Wiener process. typical-use stress -th stress level, , (with the total number of measurements under stress , the duration time of degradation test under the stress , the cumulative number of measurements up to , (with the degradation path of the product under a typical-use stress the increment of the SSADT degradation , , path, the QC of the -th test sample under the at time stress the SSADT degradation path of the -th test sample at time gamma distribution with shape parameter , and scale parameter the total budget for conductin
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