扫描微波显微镜导纳校准测量规范指南 Good practice guide for calibrated admittance measurements using scanning microwave microscopy (SMM).pptx

扫描微波显微镜导纳校准测量规范指南 Good practice guide for calibrated admittance measurements using scanning microwave microscopy (SMM).pptx

Abstract

Themeasurementofelectricalpropertiesatthenanoscaleallowsevaluatingtheperformanceofnanomaterialsdevelopedforconsumerelectronics,innovativequantumtechnologies,IoTapplicationsandlifescienceresearch.LocalDCresistancesandhighfrequency(HF)impedancesa

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