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JESD22A110B
EIA/JEDEC
STANDARD
Test Method A110-B
Highly-Accelerated Temperature and
Humidity Stress Test (HAST)
JESD22-A110-B
(Revision of Test Method A110-A)
FEBRUARY 1999
ELECTRONIC INDUSTRIES ALLIANCE
JEDEC Solid State Technology Association
NOTICE
EIA/JEDEC standards and publications contain material that has been prepared, reviewed, and
approved through the JEDEC Board of Directors level and subsequently reviewed and approved
by the EIA General Counsel.
EIA/JEDEC standards and publications are designed to serve the public interest through
eliminating misunderstandings between manufacturers and purchasers, facilitating
interchangeability and improvement of products, and assisting the purchaser in selecting and
obtaining with minimum delay the proper product for use by those other than JEDEC members,
whether the standard is to be used either domestically or internationally.
EIA/JEDEC standards and publications are adopted without regard to whether or not their
adoption may involve patents or articles, materials, or processes. By such action JEDEC does not
assume any liability to any patent owner, nor does it assume any obligation whatever to parties
adopting the EIA/JEDEC standards or publications.
The information included in EIA/JEDEC standards and publications represents a sound approach
to product specification and application, principally from the solid state device manufacturer
viewpoint. Within the JEDEC organization there are procedures whereby an EIA/JEDEC
standard or publication may be further processed and ultimately become an ANSI/EIA standard.
No claims to be in conformance with this standard may be made unless all requirements stated in
the standard are met.
Inquiries, comments, and suggestions relative to the content
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