CMOS集成电路设计3教案解析.pptVIP

June 20 - July 20, 2005 Dalian Institute of Technology, China Yann HU Design Example LHC-CMS (Compact Muon Solenoid) experiment in CERN: Diameter: 15 m Length: 21.6 m Detection of impact proton-proton Large Hadron Collider Experiences Proton-Proton Collision Electron-Positron Collision Silicon Microstrip detectors Operating principle: Detector thickness 300 mm Inter-strip spacing 25 mm Strip length 10 mm Strip width 60 mm CDET = 10 pF/strip Equivalent Scheme Charge collection for each strip: Total electrical charges: Mean current: 700 nA Equivalent scheme Electronics Readout Schematic diagram: Pre-amplifier Topologies Main characteristics: Low noise High speed Low power consumption Pre-amplifier’s Noise Performance Charge amplifiers: Transimpedance amplifiers: Pre-amplifier’s performances Charge amplifiers: Low noise level Low operating speed Transimpedance amplifiers: High noise level Rapid operating speed Pile-up Phenomenon The pile-up phenomenon is observed by a saturation of pre-amplifier Need a shaper Shaper’s characteristics The bandwidth is optimised to increase the ratio S/N of electronics readout. Return rapidly to zero in order to avoid the pile-up phenomenon. To have a large platform in order to detect a reliable maximum Semi-Gaussian Filters (CR-RCn) Transfer function: Output for a step input: Shaping time or peaking time Noise Optimisation for Capacitive readout system (charge amplifier + shaper ampifier) Output Noise Calculation Equivalent Noise Charge (ENC) at Input (1) ENC due to channel thermal noise: ENCd total noise at output: ENCd at input: Noise optimization : Optimal noise matching between source capacitance and transistor input capacitance Use of pulse shapers with large peaking time ts Equivalent Noise Charge (ENC) at Input (2) ENC due to channel 1/f noise: ENCf total noise at output: ENCf at input: Noise optimization : Optimal noise matching between sour