开关电源失效分析报告.pptVIP

3G Products C33,C34 Burnt Issue 3G产品C33,C34炸机问题 Prepared By: Ivan. Zhang Index 索引 Failure history 失效历史 Problem description 问题描述 Failure analysis 失效分析 Design experiment 设计实验 Conclusion and CA 结论和改善措施 Problem Description 问题描述 Background 背景 The C33 and C34 failure rate suddenly to rise in Jan.2009 and caused the production line to shut down. MRB meeting held to discuss the short term and long term corrective action and plant withstood big shipping pressure accordingly. 2009年11月份3G 产品C33,C34不良率大幅上升，产线因此停线。工厂召开MRB会议讨论对策，出货压力骤升。 Problem Description 问题描述 Symptom 症状 The failed units with the symptom that C33,C34,Q10,Q11 burnt at first AC start up. The units can pass all ATE test item after replacing the C33,C34,Q10,Q11. 不良机器在Run up第一个测试项目---AC start UP项起机瞬间便炸C33,C34,Q10,Q11同时击穿。更换C33,C34,Q10,Q11后机器可以通过所有ATE测试。 Failure History 失效历史 The repair record shows the failure can trace back to Jan.2009, it means such failure existed from the beginning of 3G products build in STJ plant. The failure rate is about 974 ppm. 维修记录显示失效状况可以追溯到2009年1月，也就说这种失效从3G产品在STJ工厂生产就存在着。失效率大约为974ppm。. Cause And Effect Diagram 特性要因图 Application Analysis 应用分析 Circuit analysis 电路分析 Application Analysis 应用分析 Application Analysis 应用分析 Waveform description: CH1: C33 Voltage; CH2: C34 Voltage. C33,C34 work as the snubber capacitor of Q10 and Q11, in this half-bridge topology, the C33 and C34 are charged just when the AC line turned on, when the Q10 is on, the Q11 is off, the C33 discharges at the same time; So and C34, Q11. Application Analysis 应用分析 以上波形中，CH1: C33电压波形; CH2：C34电压波形。 C33,C34作为缓冲电容保护Q10,Q11，在此半桥拓扑中，我们从上面的波形可以看到，加市电瞬间，C33,C34开始充电，Q10导通时，Q11关闭，此时C33放电；反之亦然。以此保护开关管免受瞬间尖峰电压的冲击。 The capacity can withstand 500V DC work voltage, we don’t see the actual work voltage is over its