大一阶段第二次补课答疑8点准时开始请同学们稍作等待.ppt

大一阶段第二次补课答疑8点准时开始请同学们稍作等待.ppt

大一阶段第二次补课答疑8点准时开始请同学们稍作等待.ppt

* At present, engineers looking for defects in a chip have to peel off the layers and examine the circuits visually; this is one of the obstacles ____3____. But the new magnetic microscope is sensitive enough to look inside chips and reveal faults such as short circuits , nicks in the wires or electro migration — where a dense area of current picks up surrounding atoms and moves them along. “It is like watching a river flow,” explains Xiao. A. to shrink it to the size of a desktop computer and cut the scanning B. to making chips any smaller C. to take tiny chips we require F. faults in the met

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