AFM (Atomic Force Microscope) Instructions（原子力显微镜(AFM)指令）.pdf

AFM (Atomic Force Microscope) Instructions Contact Mode AFM Advantages: • High scan speeds (throughput) • Contact mode AFM is the only AFM technique, which can obtain atomic resolution images. • Rough samples with extreme changes in vertical topography can sometimes be scanned more easily in Contact mode. Disadvantages: • Lateral (shear) forces can distort features in the image. • The forces normal to the tip-sample interaction can be high in air due to capillary forces from the adsorbed fluid layer on the sample surface. • The combination of lateral forces and high normal forces can result in reduced spatial resolution and may damage soft samples (i.e., biological samples, polymers, silicon) due to scraping between the tip and sample. Tapping Mode AFM Advantages: • Higher lateral resolution on most samples (1 nm to 5 nm). • Lower forces and less damage to soft samples imaged in air. • Lateral forces are virtually eliminated, so there is no scraping. Disadvantages: • Slightly slower scan speed than contact mode AFM. Scanning Technique with Multimode SPM Contact AFM— Measures topography by sliding the probe’s tip across the sample surface. Operates in both air and fluids. Tapping Mode™ AFM—Measures topography by tapping the surface with an oscillating tip. This eliminates shear forces, which can damage soft samples and reduce image resolution. Tapping Mode is available in air and fluids (patented). This is now the technique of choice for most AFM work. Phase Imaging— Provides image contrast caused by differences in surface adhesion and viscoelasticity. Requires an Extender™ Electronics Module (patent pending). Non-contact AFM— Measures topography by sensing Van der Waals attractive forces between the surface and the probe tip held above the surface. Provides lower resolution than either contact AFM or Tapping Mode. Magnetic Force Microscope (MFM)— Measures magnetic force gradient distribution above the sample su