手机ES的防护与设计.doc

本科毕业设计（论文） 学 院 专 业 年级班别 学 号 学生姓名 指导教师 2013年6月 摘 要 现代半导体器件的规模越来越大，工作电压越来越低，导致了半导体器件对外界电磁骚扰敏感程度也大大提高。ESD对于电路引起的干扰、对元器件、CMOS电路及接口电路造成的破坏等问题越来越引起人们的重视。电子设备的ESD也开始作为电磁兼容性测试的一项重要内容写入国家标准和国际标准。 本文对ESD手机产生的危害和ESD的形成机理作较详细分析，重点研究手机设计中的ESD问题及防护 关键词： Abstract With the development of society, the products of wireless communication have been applied to various kinds of fields, but the Electro-Static Discharge (ESD) problem is increasingly conspicuous. As a wireless communication product, the mobile phone has become one of the societys most popular electronic products, the Electro-Static Discharge(ESD) is still one of the main reasons which is caused by the fault, it is also the cause of damage function disordering electronic products ,equipment and parts. Nowadays , the scope of semiconductor devices is becoming larger and larger, and its working voltage is more and more low, resulting in the semiconductor devices to external electromagnetic disturbance sensitivity is greatly improved. The destruction and other issues resulting from the Electro-Static Discharge(ESD),such as interfere the circuit of components, CMOS and interface circuit ,caused more and more attention. The Electro-Static Discharge (ESD) of the electronic equipment also began to write to national and international standards as an important content of electromagnetic compatibility testing. This passage is to study the detailed analysis of the formation mechanism and the harm of ESD on the production of mobile phone; and the ESD problem and the protection measures focus on the design of mobile phone. Key words: Mobile phone, The Electro-Static Discharge,ESD,Protection 目 录 1 绪论 1 1.1 课题研究的背景及目的 1 1.2 ESD产生的原理 2 1.2.1 静电释放的定义 2 1.2.2 静电释放的产生及特点 2 1.2.3 ESD的模型及标准 2 1.3 静电对手机的危害 6 1.3.1 静电对电子元件的危害 6 1.3.2 静电对电