先进材料表征技术-(II)课件.pptVIP

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先进材料表征技术-(II)课件

Advanced Technology for Materials Characterization (Part IV); Hyphenated technology of GC-MS; Surface area and pore structure analysis.;(II) GC-MS;Mass spectrometry is a powerful analytical technique for forming gas-phase ions from intact, neutral molecules and subsequently determining their molecular masses. All mass spectrometers have three essential components: an ion source, a mass analyzer, and a detector. Ions are produced from the sample in the ion source using a specific ionization method. The ions are separated in the mass analyzer based on their mass-to-charge (m/z) ratios and then detected, usually by an electron multiplier. The data system produces a mass spectrum, which is a plot of ion abundance versus m/z. Except in the case of electrospray mass spectrometry (where the ion source is at atmospheric pressure), the ion source, mass analyzer, and detector are usually situated inside a high-vacuum chamber (pressure between 10?8 and 10?4 Torr).;Classification:; Mass spectrometry’s characteristics have raised it to an outstanding position among analytical methods: unequalled sensitivity, detection limits, speed and diversity of its applications. In analytical chemistry, the most recent applications are mostly oriented towards biochemical problems, such as proteome, metabolome, high throughput in drug discovery and metabolism, and so on. Other analytical applications are routinely applied in pollution control, food control, forensic science, natural products or process monitoring. Other applications include atomic physics, reaction physics, reaction kinetics, geochronology, inorganic chemical analysis, ion–molecule reactions, determination of thermodynamic parameters (△G?f, Ka, etc.), and many others.; In 1898, W. Wien, by the use of very powerful magnetic fields, proved that the positive rays were deflected by magnetic forces. In 1897 the mass-to-charge ratio m/e of the electron was first measured by J. J. Thomson. (J. J. Thomson, was a Britis

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