run-length-based test data compression techniques how far from entropy and power bounds—a surveyrun-length-based测试数据压缩技术有多远从熵和权力界限的调查.pdfVIP

Hindawi Publishing Corporation VLSI Design Volume 2010, Article ID 670476, 9 pages doi:10.1155/2010/670476 Review Article Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?—A Survey Usha S. Mehta,1 Kankar S. Dasgupta,2 and Niranjan M. Devashrayee1 1 Department of Electronics and Communication, Nirma University, Ahmedabad 382481, India 2 Space Application Center, ISRO, Ahmedabad 380015, India Correspondence should be addressed to Usha S. Mehta, usha.mehta@nirmauni.ac.in Received 23 July 20