test generation for crosstalk-induced delay faults in vlsi circuits using modified fan algorithm由于时滞故障测试生成的超大规模集成电路使用fan算法修改.pdfVIP

Hindawi Publishing Corporation VLSI Design Volume 2012, Article ID 745861, 10 pages doi:10.1155/2012/745861 Research Article Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm S. Jayanthy,1 M. C. Bhuvaneswari,2 and Keesarapalli Sujitha3 1 Department of ECE., Sri Ramakrishna Engineering College, Tamil Nadu, Coimbatore 641022, India 2 EEE Department, P.S.G. College of Technology, Tamil Nadu, Coimbatore 641004, India 3 M.E Applied Electronics, P.S.G. College of Technology, Tamil Nadu, Coimbatore 6