surface morphology and sensing property of nio-wo3 thin films prepared by thermal evaporationnio-wo3薄膜的表面形态和遥感属性由热蒸发.pdfVIP

下载本文档

0
0
约4.13万字
约 10页
2017-09-12 发布于上海
举报
版权申诉

surface morphology and sensing property of nio-wo3 thin films prepared by thermal evaporationnio-wo3薄膜的表面形态和遥感属性由热蒸发.pdf

1、本文档共10页，可阅读全部内容。
2、原创力文档（book118）网站文档一经付费（服务费），不意味着购买了该文档的版权，仅供个人/单位学习、研究之用，不得用于商业用途，未经授权，严禁复制、发行、汇编、翻译或者网络传播等，侵权必究。
3、本站所有内容均由合作方或网友上传，本站不对文档的完整性、权威性及其观点立场正确性做任何保证或承诺！文档内容仅供研究参考，付费前请自行鉴别。如您付费，意味着您自己接受本站规则且自行承担风险，本站不退款、不进行额外附加服务；查看《如何避免下载的几个坑》。如果您已付费下载过本站文档，您可以点击这里二次下载。
4、如文档侵犯商业秘密、侵犯著作权、侵犯人身权等，请点击“版权申诉”（推荐），也可以打举报电话：400-050-0827(电话支持时间：9:00-18:30)。
5、该文档为VIP文档，如果想要下载，成为VIP会员后，下载免费。
6、成为VIP后，下载本文档将扣除1次下载权益。下载后，不支持退款、换文档。如有疑问请联系我们。
7、成为VIP后，您将拥有八大权益，权益包括：VIP文档下载权益、阅读免打扰、文档格式转换、高级专利检索、专属身份标志、高级客服、多端互通、版权登记。
8、VIP文档为合作方或网友上传，每下载1次，网站将根据用户上传文档的质量评分、类型等，对文档贡献者给予高额补贴、流量扶持。如果你也想贡献VIP文档。上传文档

surface morphology and sensing property of nio-wo3 thin films prepared by thermal evaporationnio-wo3薄膜的表面形态和遥感属性由热蒸发

Sensors 2005, 5, 519-528 sensors ISSN 1424-8220 © 2005 by MDPI /sensors Surface Morphology and Sensing Property of NiO-WO Thin 3 Films Prepared by Thermal Evaporation 1 2 3 4 Dong-myong Na , L. Satyanarayana , Gwang-Pyo Choi , Yong-Jin Shin and Jin Seong Park 1,* 1 Department of Advanced Materials and Engineering, Chosun University, Gwangju 501-759, Korea. 2 Research Institute of Energy Resources Technology, Chosun University, Gwangju 501-759, Korea. 3 JAMIC, Sunchun, Jeonnam 540-856, Korea 4 Department of Physics, Chosun University, Gwangju 501-759, Korea *Author to whom correspondence address should be addressed: jsepark@chosun.ac.kr Received: 18 November 2005 / Accepted 30 November 2005 / Published: 1 December 2005 Abstract: WO3 and NiO-WO3 thin films of various thicknesses were deposited on an Al O -Si (alumina-silicon) substrate using high vacuum thermal evaporation. After 2 3 o annealing at 500 C for 30 minutes in air, the crystallanity and surface morphology of WO3 and NiO-WO3 thin films were investigated using X-ray diffraction (XRD) and Scanning Electron Microscopy (SEM). It is observed that the WO3 thin films were resulted in cracks between the polycrystalline grains and the grain growth was increased