x-ray photoelectron spectroscopy (xps) depth profiling for evaluation of la2zr2o7 buffer layer capacityx射线光电子能谱(xps)la2zr2o7缓冲层的深度分析评估能力.pdfVIP

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x-ray photoelectron spectroscopy (xps) depth profiling for evaluation of la2zr2o7 buffer layer capacityx射线光电子能谱(xps)la2zr2o7缓冲层的深度分析评估能力.pdf

x-ray photoelectron spectroscopy (xps) depth profiling for evaluation of la2zr2o7 buffer layer capacityx射线光电子能谱(xps)la2zr2o7缓冲层的深度分析评估能力

Materials 2012, 5, 364-376; doi:10.3390/ma5030364 OPEN ACCESS materials ISSN 1996-1944 /journal/materials Article X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La Zr O Buffer Layer Capacity

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