tektronix示波器培训.pptVIP

* 损坏探头的原因 机械损坏 探头各部位的机械损伤：断裂、堵塞变形 电气损坏 电应力过度(EOS－Electrical Overstress )损伤：探头无法工作 静电放电(ESD－Electro Static Discharge )损伤：探头无法工作 * 机械损坏之一 探测时给探头施加过度的压力 例子：P7330探头的绿色标签“Read This First”明确指出，探头必须垂直接触DUT,且压力不可超过3.0lbs（1.36kg）! 探测完毕之后未及时从DUT上移走 例子：探针插入测试孔，完成测试后未及时移走，无意中的触碰、拉扯容易造成探针断裂事件。 非常规的进行探针焊接 例子：将P7260探头焊接在内存条上；某工程师将P6139探针插入测试孔并焊接。探针周围的塑料被高温熔化造成探针松动。此外，接地不良的烙铁常常会漏电击毁探头。 * 机械损坏之二 使用非正式的探针 例子：使用非正式的短探针插入P6245探头中，造成探针无法拔出。 使用探针不当 例子：用探针来刮开PCB板上的阻焊涂层(绿油)，造成探针根部的塑料开裂 * 电气损坏之一：EOS 探头长期探测超出量程的信号 例子：长期使用P6243探头测试12V电源上电波形。过了一段时间，探头前端剧烈发热，从此不能再进行测量 探头长期不带地线进行测试 例子：因找不到接地点，长期不带地线进行测试，而由于使用了劣质的电源插线板，DUT与示波器存在几十伏特的电位差，造成探头损坏。 普通有源探头测高压 例子：认为上千美元一个的探头肯定耐扛，测220V交流电没问题。 * 电气损坏之二：ESD 探头不带防静电措施储存 例子：在某实验室，打开抽屉，里面全是探头，但没有一个有防静电袋包装，全部曝露在环境中。 探头在无防静电措施下携带并运输 用手指触碰探头前端 * * * * * Here the same signal was looked at with the max bandwidth of this scope, and a lower bandwidth using a filter. See how the elimination of higher frequencies causes the rise and fall times to extend out? Also be aware that any signals that are in that frequency range that are riding on top of the wave will also be lost. * * The need is for an oscilloscope that can help you analyze complex signals in real time, with visual and statistical interpretation. * The trigger combinations offered by the Pinpoint trigger system give the user the ultimate flexibility in triggering on high speed digital signals enabling even the most elusive events to be captured. This graphic shows typical trigger selection in previous high performance scopes – you only had the ability to set up 6 different sequences. The Pinpoint Triggering’s Sequential Trigger Logic and allows for XXX different event sequences. Many oscilloscopes only support the trigger sensitivity for edge triggering. If you try to choose advanced triggers, the trigger sensitivity’s supported frequency falls below the useful range. Because Silicon Germanium is used in the whole Pinpoint trigger system, all features are available to the 7GHz se