本章介绍三种Attributecontrolcharts1.Controlchartfor.pptVIP

Back Data for trial control limits, Example 1 sample size n=50 Back Initial fraction nonconforming control chart for the data in Example 1 Back Revised control limits for the data in Example 1 Back Orange juice concentrate can data in samples of size n=50 Back Continuation of the fraction nonconforming control chart, Example 1. Back New control limits on the fraction nonconforming control chart, Example 1. Back New data for the fraction nonconforming control chart in Example 1, n=50 一般而言，c chart較p chart更具資訊（因為通常 nonconformities有數種型態）。 e.g. 上例中，for defect data 500 boards的data以 Pareto chart分析之，見附圖，可發現超過60% 的defect數目與焊接不完全及solder cold joints 相關，由此可見，若能isolate及eliminate wave soldering process的問題，則對process yield必 有很大的改進。 1. 在此大部分的defects attributable to a few（在此為two）defect types，此現象我們稱該nonconformities follow a Pareto distribution。 2. 見附表，對printed circuit board的不同type nonconformities的分析。 全部40個焊接不完全及20個solder cold joints均發生在part 0001285號上。 此種board在焊接上常會出狀況。 3. 以cause effect diagram分析：如附圖，在上述分析知主要問題來自solder process，可由此來協助選取designed experiment的variables以optimize wave soldering的過程。 Sample size：n inspection units （e.g. n=2.5） 1. Revised chart is the observed mean number of nonconformities in the original inspection unit. 2. 用u chart represents the observed average number of nonconformities per unit in a preliminary set of data. If we find c total nonconformities in a sample of n inspection units, then the average number of nonconformities per inspection unit is 每次抽樣中，inspection unit的個數。 Note that c is a Poisson random variable. Example 3 PC製造商 1個PC = 1個inspection unit Sample size = 5個inspection units 共有20個samples（如附表）。 雖無lack of statistical control，但u太過大（如附圖）。 結論：Management must take action to improve the process. Alternative Probability Models for Count Data （可用來描述Count data的其他機率模型） E.g. nonconformities是以cluster出現 參考文獻：Jackson（1972）, Leavenworth（1976）,