连接器等高速互连测试和分析的解决方案.pptVIP

Measurement based model extraction can be accomplished using a variety of methods. The ultimate goal is to achieve an accurate model that can be simulated in either the time domain or frequency domain. Most digital designers will focus on time domain models. Either a topological model or behavioral model may be developed. The topological model is based on the physical structure of the device and can be very complex for a lengthy device exhibiting multiple impedance discontinuities. This requires multiple iterations and is easily done using today’s standard PC computational power. The behavioral model is a “black box” approach and describes how the device behaves toward a particular stimulus. One type of behavioral model is scattering parameters or S-parameters. This flowchart shows a probe station that uses both time domain test equipment (Time Domain Reflectometer or TDR) and frequency domain test equipment (Vector Network Analyzer or VNA) to measure prototype devices. Both test instrument types have strengths and weaknesses and the specific user application will normally dictate the use of one or the other. In general, the TDR is easier to use and the VNA is more accurate. Most signal integrity laboratories have one of each. For high performance devices, most measurements are made with a VNA using the Agilent N1930A Physical Layer Test System software to control the VNA via GPIB. This allows for use of the automated calibration wizard and simplified this typically rigorous and error prone process. The resultant 4-port S-parameter data can be exported to the TDA Systems IConnect MeasureXtractor model extraction tool that in turn can creat an accurate time domain Hspice model. One of the challenges for making high quality measurements is to have repeatable, accurate and traceable data. The foundation for these quality measurements in test system calibration. There are many types of calibration that vary in ease-of-use and accuracy. Often, the most accurate calibrat