贴片电容测试方法-改.pdfVIP

Chip Monolithic Ceramic Capacitor 贴片独石陶瓷电容器 Testing / Measuring Condition 测试/测定条件 Note : 注 : The information of this material are as of the date mentioned above. They are subject to change without advance notice. If there are any questions, please contact our sales representatives or product engineers. 对于这些材料信息以上面的日期为准。信息若有变更，恕不另行通知。若有任何疑问，请与我公司销售代表或产品工程师联系。 Contents Contents 内容 内容 1. Measuring Equipment Fixture 测量设备和治具 2. Calibration of Measuring Equipment 校正测量设备 3. Q/D.F. Specification Test Condition (MLCC) Q/D.F.的规格和测试条件（MLCC ） 4. Measuring Procedure 测量程序 5. Additional Information 附加信息 1. Measuring Equipment 1. Measuring Equipment 测量设备 测量设备 Generally, we use the “LCR Meter” as instrument for measuring ‘Capacitance Value’ and ‘D.F.’. Typical LCR Meters is “4284A” and “4286A” of Agilent Technologies. We can proceed testing including HI-CAP.(1uF≦Capacitance Value) 一般来说，我们都运用“LCR 测定计”作为测量电容量和“D.F.”的工具. 典型的LCR测定计是Agilent 的“4284A”和“4286A”。 我们可以测试高容量的电容器。（1uF≦容量） 4284A 4268A Photo 1. Picture of measurement instrument 图片1. 测量工具的图片 1. Measuring Equipment (Fixture) 1. Measuring Equipment (Fixture) 测量设备（固定设备） 测量设备（固定设备） The measurement test fixture should choose the one suitable for the LCR meter. The typical test fixture used for the chip type is as followings. There are two type measurement test fixture. The one like 16034E, we put a chip at certain spot of the test fixture, and chip is measured by putting a pin to edge side of a chip. The other like 16334E, the shape is tweezers, we grip both ends of a chip and measure. 测试治具应该选择一个合适于LCR测定计的测试治具。 典型的适应于贴片类型测试治具如下所示。 有两种测量测试治具。 其中一个如16034E ，将一个贴片放测试治具的测试点，然后贴片就会被一个顶针的一边所测量。 另外如16334