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- 2024-03-28 发布于重庆
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Designation:F576–00
StandardTestMethodfor
MeasurementofInsulatorThicknessandRefractiveIndex
onSiliconSubstratesbyEllipsometry1
ThisstandardisissuedunderthefixeddesignationF576;thenumberimmediatelyfollowingthedesignationindicatestheyearof
originaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.A
superscriptepsilon()indicatesaneditorialch
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