Impact_of_Measunist-测量设置对低温互补式金属氧化物半导体 FET 表征的影响 Impact of Measurement Setup on Cryogenic CMOS FET Characterization.pdf

Impact_of_Measunist-测量设置对低温互补式金属氧化物半导体 FET 表征的影响 Impact of Measurement Setup on Cryogenic CMOS FET Characterization.pdf

IEEEELECTRONDEVICELETTERS,VOL.47,NO.6,JUNE20261057

ImpactofMeasurementSetuponCryogenic

CMOSFETCharacterization

Jhih-WeiChen,J.P.Campbell

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