SMART-1 OpenShort Tester半导体器件开短路测试机測試培训教程.pdf

SMART-1 OpenShort Tester半导体器件开短路测试机測試培训教程.pdf

OSTESTCO.,LTD.

Ohm’sLaw(R=V/I)

O/StestItemonthesemiconductortest

•I/OPins

–Verifyproperconnectionsbetweenthetest

systemandtheDUT

–CheckiftheESDdiodefunctionofI/Opinsis

fail.(ShortedPins,missingbondwires,pinsdamagedfromESD,...)

–Twotestmethods,DC(ForceI/MeasureV)

lowUPH,Pattern(ForceI/CompareV)HighUPH

•Power/GroundPins

–Force0.2Vonpower/ground,ifthemeasured

currentLimit,thenpowerpinsareshort.

–Nottoche

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