8051系列微机控制器对瞬时故障的容错能力的合成——外文翻译.doc

Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults This paper presents the implementation of a fault detection and correction technique used to design a robust 8051 micro-controller with respect to a particular transient fault called Single Event Upset (SEU). A specific study regarding the effects of a SEU in the micro-controller behavior was performed. Furthermore, a fault tolerant technique was implemented in a version of the 8051. The VHDL description of the fault-tolerant microprocessor was prototyped in a FPGA environment and results in terms of area overhead, level of protection and performance penalties are discussed. 1. Introduction The constant improvements achieved in the microelectronics technology allow the manufacturing of very complex circuits, substituting boards or even computers of the past 80’s. Nowadays, because of the microelectronics advances, traditional applications become cheaper and more reliable, while a large range of new applications can take advantage of integrated devices by using the so-called embedded systems. In all cases, architectures are strongly based on some kind of data processor, such as a micro-controller or a DSP processing unit, for example. The continuous decrease in the semiconductor dimensions and in electrical features, leads to an increasing sensitivity to some effects of the environment (ionization due to radiation, magnetic perturbations, thermal,...) considered minor or negligible in the technologies of the past. Particularly, digital circuits operating in space are subject to different kinds of radiation. However, some problems have also been reported for some Earth applications, like avionics systems . Radiation effects can be permanent or transient . Permanent faults result from particles trapped at the silicon/oxide interfaces and appear only after long exposure to radiation (Total Ionization Dose). Transient faults (Single Event Effects, SEE) may be caused by the impact of a single charged