晶圆测试系统送进装置设计（有CAD图纸）.pdf

(1) (2) (3) (4) (5) (6) (7) Title Design of the device to the wafer testing system Abstract This paper introduces the development situation of testing a wafer, wafer test feeding device structure design principle, wafer test to analysis and determine the overall plan arrangement, drawing the mechanical drawings wafer test to design device structure includes the calculation of the feeding device, the structure design, the conclusions and recommendations to the device. The structure is mainly produced by the motor power through the coupling will need to transfer the power to the belt wheel, belt wheel drives the guide slipper, heavy labor movement device to drive the feeding device can replace the manual, greatly reduce the labor intensity of workers, improve working conditions, improve labor productivity and automation level of production. Industrial production in the often cumbersome workpiece handling and frequent, the long, monotonous operation, the feeding device is effective; in addition, it can operate in high temperature, low temperature, water, the universe, radioactive and other toxic, environmental pollution condition, more show its superiority, there are broad prospects for the development. The research of this thesis: (1) testing to the general structure design of e