X-Ray Diffraction.ppt

X-Ray Diffraction The XRD Technique Takes a sample of the material and places a powdered sample which is then illuminated with x-rays of a fixed wave-length. The intensity of the reflected radiation is recorded using a goniometer. The data is analyzed for the reflection angle to calculate the inter-atomic spacing. The intensity is measured to discriminate the various D spacing and the results are compared to known data to identify possible matches. Powdering Samples The samples are powdered to give a random sampling of ALL atomic planes (crystal faces) Statistically accurate given samples ar