Reflections Function Method In the XRay Reflectometry.pdfVIP

Reflections Function Method In the X - Ray Reflectometry N.V. Bagrets, E.A. Kravtsov, V.V. Ustinov. Institute of Metal Physics, 18, Kovalevskaya St., Ekaterinburg, 620219, Russia (Dated: February 1, 2008) 2 The theory of specular X-ray reflectivity from a rough interface based upon the reflection function 0 method (RFM) is proposed. The RFM transforms the second order differential equation for the 0 wave amplitude into the non-linear first order differential equation of Riccati type for the reflection 2 function. This equation is solved in the approximation of the abruptly changing potential, which is justified for the typical angles of X-ray reflectometry. The reflectivity is represented as a series. The y first term of this series reproduces the Nevot-Croce approximation and second one gives the phase a correction for greater angles. It is shown that the phase correction can be used to obtain the degree M of interface asymmetry. The X-ray reflectometry model profiles for Fe/Cr superlattice are used to illustrate the method. 5 ] The X-ray reflectometry is a useful tool for studying electric field E (z) in the form i c surface and interface structure in thin films and multi- s- layers. Usually, the rough surface X-ray reflection is an- −1/2 i z l E (z) = q (z) A(z) exp 2 q (x)dx + r alyzed in the framework of the plane-wave Born approxi- z0 t mat