Study of radiation hardness of HfO2-based resistive switching memory at nanoscale by conductive atomic force microscopy》.pdfVIP

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Study of radiation hardness of HfO2-based resistive switching memory at nanoscale by conductive atomic force microscopy》.pdf

Study of radiation hardness of HfO2-based resistive switching memory at nanoscale by conductive atomic force microscopy》.pdf

Microelectronics Reliability xxx (2015) xxx–xxx Contents lists available at ScienceDirect Microelectronics Reliability journal homepage: www.elsevi /locate/microrel Study of radiation hardness of HfO -based resistive switching memory 2 at nanoscale by conductive atomic force microscopy Sh

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