Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution.pdfVIP

Hindawi Publishing Corporation Advances in Materials Science and Engineering Volume 2009, Article ID 928545, 6 pages doi:10.1155/2009/928545 Review Article Dielectric Spectroscopy Analyses of SrBi Ti O Films Obtained 4 4 15 from Soft Chemical Solution ˜ 1 2 A. Z. Simoes and C. S. Riccardi 1 Universidade Federal de Itajuba—Unifei, Campus Itabira, Rua Sao Paulo, 377, Bairro: Amazonas, 35900-37 Itabira, MG, Brazil ´ ˜ 2 Laboratorio Interdisciplinar em Ceramica, Departamento de Fısico-Quımica, Instituto de Quımica, Universidade Estadual Paulista, ´ ˆ ´ ´ ´ Bairro: Quitandinha, 14800-900 Araraquara, SP, Brazil ˜ Correspondence should be addressed to A. Z. Simoes, alezipo@ Received 22 June 2009; Revised 14 September 2009; Accepted 9 October 2009 Recommended by Zoe Barber SrBi Ti O (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films 4 4 15 were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 μC/cm2 and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric mat