液质联用仪AB4500usertraining解读.pptVIP

MS/MS 二级质谱联用的扫描方式 MS/MS二级质谱联用的扫描方式 Product Ion产物离子扫描 分析母离子的碎片离子信息 Precursor Ion母离子扫描 分析产生特定子离子的母离子的信息 Neutral Loss中性丢失扫描 分析产生特定中性丢失碎片的母离子的信息 MRM (Multiple Reaction Monitoring)多反应离子监测 对多对母离子/子离子信号进行监测 用于定量,具有高灵敏度和高选择性 在所有的 MS/MS 模式中,Q1 Q3 处于质量分析器模式 Q3 能够扫描，或者固定在某几个质量数 Q2 产生的离子进入 Q3 产物离子扫描Product Ion Scan CAD gas 923 Q1 选定母离子 Q2 与气体碰撞产生碎片 Q3 扫描子离子 226 497 502 质荷比amu 502 497 226 母离子 与气体碰撞产生碎片 质谱图 强度 200 800 母离子扫描Precursor Ion Scan 1289 923 609 532 Q1扫描离子 Q2与气体碰撞产生碎片 Q3 监测特定的子离子 质谱图 532 923 1289 强度 质荷比amu 多反应离子监测– MRM 765 335 923 532 923/765 532/335 Q1 选定母离子 Q2 与气体碰撞产生碎片 Q3选定子离子 信号图 时间 强度 Any Questions?? * * * * * The probe tower houses the probe, the gas, the electrical connections and the vertical and horizontal tuning adjustments. The source is a “no wire,” “no gas plumbing” source similar to the API 2000 configuration * * Ions are focused into skimmer by shape design in API 4000 instrument (and electronically by FP on the focusing ring in API 2000 and API 3000) * For general presentation? * * For general presentation- Animation can be turned off. * For general presentation * * * Detector consists of CEM, DF signal handling circuit card (all in one assembly) Ions are attracted to CEM “horn” voltage Deflector (DF) enhances electric field around CEM horn to aid ion attraction Ion striking the horn generates a “pulse” Pulse passes onto computer as a signal Horn voltage is fixed: Positive ion: -6000V Negative ion: +4000V Bias voltage set by operator 2000 to 3000V more positive than horn voltage Deflector voltage set by operator (+400V) * * * Q3 is used for IDA experiments due to system being too slow to measure accurate masses using Q1 * Q3 is used for IDA experiments due to system being too slow to measure accurate masses using Q1 * * * MRM is so sensitive because the Mass spec. only ‘scans’ on the ion(s) of interest. No other data is collected so no wasted data. * * Is B accurate? * TripleQuad 4500 Operator Training 4500 用户培训 用液相或注