CODE说明书翻译-2.docVIP

Simple layers are used in most cases to represent a thick or thin layer of a material in the stack. Simple layers have a thickness (always specified in microns) and you must assign a material to it. In addition, you can choose between two modes of handling the contributions from multiply reflected partial waves, as discussed below. Some considerations about wave propagation through layer stacks are discussed in [Harbecke 1986A], in particular the superposition of partial waves. In the case of thin layers, the partial waves reflected at the top interface and those that travel through the layer and are reflected back at the bottom interface must be superimposed to the total reflected wave by summing up their amplitudes, taking into account the phase. This may lead to constructive or destructive interference, depending on the wavelength of light. This kind of superposition is called coherent. The interference fringes observed in reflection or transmission spectra get very narrow if the thickness of the layer becomes larger and larger. Eventually the narrow structures are not resolved experimentally due to the limited resolution of spectrometers, or due to thickness inhomogeneities over the investigated sample spot which may lead to a cancellation of the interference structures. In these cases the measured spectra are quite smooth as the red one shown below, whereas the simulated blue spectrum shows interference fringes. As can be seen the sharp structures are not resolved completely in the simulation, either. 样片层（simple layers）在大多数情况下在膜栈中代表一种材料的厚层或薄层。样片层有一个厚度，你必须给它指定一种材料。另外，你能在两种模式（handling the contributions from multiply reflected partial waves）下选择，描述如下。关于电磁波通过膜栈的一些现象要考虑进去，特别是波的叠加。在薄膜栈中，波在膜栈中反射和透射，由于相位的不同（取决于光波的波长），在顶层和底层中会发生叠加或抵消，这种叠加叫作“干涉”。这种干涉条纹可以在反射或透射光谱中观察到，并且膜层的厚度越厚，干涉条纹会越窄。最后这种窄的干涉结构由于分光计的限制将不能被观察到；或由于厚度的不均匀性超过了样片污点的影响（样片污点可能导致这种干涉结构的失效。在这种情况下测量光谱非常地光滑，就像下面红色曲线显示的一样。然而模拟的蓝色光谱显示了干涉条纹。在模拟光谱中可以看到峰值结构没有被完全淡化掉。 Instead of doing the tedious task to compute a lot of