基于单片机的TTL集成电路芯片测试仪的设计.docVIP

摘 要 集成电路（IC）测试是伴随着的发展而的，数字芯片在使用过程中容易被损坏，肉眼不易观察因此很需要设计能够测试芯片好坏的仪器。本系统以AT89C52为核心,由键、显示、电源控制模块等组成根据数字以及集成芯片的真值表测试程序能完成TTL74、54系列数字集成芯片的功能测试。 ABSTRACT Integrated circuit (IC) test is accompanied with the development of electronic technology, Digital integrated chip is easily damaged during use, and difficult to observe with the naked eye. Early manual test methods for some high integration, the logic of complex digital integrated circuits become difficult，thus gradually replaced by automated testing, so it is necessary to design a testing instrument to distinguish the Common