kis-3r3 DCDC模块简改成5V输出并简测纹波.docVIP

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kis-3r3 DCDC模块简改成5V输出并简测纹波.doc

kis-3r3 DCDC模块简改成5V输出并简测纹波

用3R33改做5V电源,不要拆3R33上的二极管,留最后一道保护! 2012-1-22 00:12 上传 下载附件 88.29 KB 大家在用3R33改5V输出时受上图误导,第一步就是开壳拆掉那个二极管和小电容,别人拆二极管是为了改较高电压输出,据说那个稳压二极管是6.xV的,那么改做6V以下的输出就不要辛苦开壳拆元件了! 改5V只要在Vadj端与GND端并上一个10K的电阻就行了(如并9K电阻输出约5.2V),再在Vout端与GND端并上一个电解电容改造工作就完成了,不用开壳甚至连洞洞板都不用。kis-3r33?DCDC模块简改成5V输出并简测纹波 官方 3r33主芯片MP2307的典型应用原理图: 右侧为原装未改的3r33模块 右侧为原装未改的3r33模块 左侧为修改为5V输出的3r33模块: 正面改动: 1.去掉输出端稳压二极管 耐压不足 2.去掉输出端的滤波贴片电容 耐压不足 3.焊接上一个16V 220uF的电解电容 滤波 右侧为原装未改的3r33模块 左侧为修改为5V输出的3r33模块: 方面改动: 4. adj和GND之间焊接一个10K电阻 测试输出特性: 输入: 8V稳压源, 后续打算用两节锂离子电池串联后连接, 变成一个5V的移动电源 负载: 纯阻抗型负载, 10W 10欧姆水泥电阻并联 输出特性图: 分别在其空载, 10欧姆? 5欧姆 和3.33欧姆负载下测试纹波特性 因为数采的采样率仅为100KHz, 不及该模块的工作频率, 无法准确捕捉瞬态纹波图 所以只能定性的用1s累计波形来粗算其纹波电压, 实际中, 纹波电压跟所更换的电容容值和品质有很大关系. 此次测试下来, 纹波特性约为60~70mV. and due diligence evaluations article 22nd head office, branch jurisdiction , risk management, marketing management branch within the Departments credit business person assumed responsibility for the supervision and inspection and due diligence evaluations. Article 23rd, Head Office, branches jurisdiction , risk management, Marketing Management Department through on-site and off-site inspection, investigation report, interviews with investigators for pre-loan investigation work by way of conducting supervision and inspection, quality evaluation pre-loan investigation work, and based on the evaluation results, the implementation of diversity management. 24th the control and inspection a the implementation of the credit system: there is no breach of credit policy relating to the granting of credit and the head office; B dual credit rating: timeliness of ratings, whether the provisions of the rating, rating results are accurate; C the survey contents: data collection is complete, report writing is comprehensive, indicators analysis is objective, real, conclusions and the facts are consistent and reasonable; D double implementation of investigations system: practical implementation of double system; E other supervision and inspection of the c

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