固体物理,考试,led,SolidStatePhysics-2分解.ppt

* SSP Lecture Notes -Fall * * SSP Lecture Notes -Fall * Bruker D8 Triple Axis Diffractometer For GIXD and for analysis of rocking curves, lattice mismatch, and reciprocal space maps of thin films and semiconductors This instrument is typically used to measure the perfection or imperfection of the crystal lattice in thin films (i.e. rocking curves), the misalignment between film and substrate in epitaxial films, and reciprocal space mapping. High precision Bruker D8 triple axis goniometer Beam-conditioning analyzer crystals remove Ka2 radiation and provide extremely high resolution. * SSP Lec