Fault Coverage Analysis of RAM Test Algorithms Paradise内存测试算法的故障覆盖率分析天堂.pptVIP

Fault Coverage Analysis of RAM Test Algorithms Marc Riedel McGill University, Montreal, Canada Janusz Rajski Mentor Graphics, Wilsonville, Oregon Outline Motivation Fault Models Methodology and Complexity Fault Simulation Results Conclusions Motivation Coverage Measures Needed Functional Cell Array Model Bit-addressable 2-D array of binary storage elements: Functional Fault Behavior Sensitized/desensitized by write operations. Detected by read operations. Cell Array Fault Models Fault Model Specification Fault models are specified as inputs, not hard-coded. Ex.: 2-cell OR-type Bridging