AMISCA 2008 National Semiconductor Presentation.ppt

Challenges of Single Event Upset and Transient Testing and Characterization of Mixed Signal Products Kirby Kruckmeyer Agenda Overview of National Semiconductor’s radiation programs Standards and guidelines for Single Event Effect (SEE) testing of mixed signal products Test conditions Reporting Errors Single Event Upset and Transient Definitions Challenges for SEE testing Case Studies Ultra High Speed Analog to Digital Converter Ultra Low Power Digital to Analog Converter Summary National - A Major Space Supplier 30+ years in the Space Market QMLV qualified products One of only 10 RHA (Radiation Hardness Assured) QML suppliers Radiation Testing TID 60Co gamma cell in South Portland, Maine and Santa Clara, California ELDRS: ELDRS Free products SEE: SEL, SEU and SET testing Per EIA/JEDEC JESD57 and ESA/SCC 25100 World class Supply Chain Management Dedicated space program managers Total Dose Improvements on Legacy Products Radiation process developed to improve total dose performance - National’s Scotland plant LM137 10 krad 30 krad LF411 10 krad 50 krad LM101 10 krad 50 krad LM111 10 krad 100 krad LM136 10 krad 100 krad LM158 10 krad 100 krad LM124 10 krad 100 krad LM139 10 krad 100 krad LM117 10 krad 100 krad LM117HV 3 krad 100 krad LP2953 10 krad In Process ELDRS-Free Products! We test them so you don’t have to Every wafer tested and qualified at low dose rates per Mil-Std-883 method 1019 condition D Low dose rate of 10 mrad/s (36 rad/hr) Biased and unbiased DSCC unique low dose rate certified part numbers ELDRS Free Products LM111 LM117 LM124 LM136-2.5 LM139 LM158 LM193 LMP2012 Low Dose Rate Qualified LM117HV National is more than just the LM124 Recent New Product Releases: ADC08D1000WGFQV 1 GS/s 8 bit Analog to Digital Converter ADC08D1520WGFQV 1.5 GS/s 8 bit Analog to Digital Converter ADC128S102WGRQV General Purpose 12 bit Analog to Digital Converter – mW Power DAC1