A method to compute the migration rate of planar solid–liquid interfaces in binary alloys.pdf
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A method to compute the migration rate of planar solid–liquid interfaces in binary alloys
Journal of Crystal Growth 253 (2003) 549–556
A method to compute the migration rate of planar solid–liquid
interfaces in binary alloys
R.S. Qin, E.R. Wallach*
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK
Received 10 December 2002; accepted 20 February 2003
Communicated by M. Uwaha
Abstract
A method for computing the migration rate of planar solid–liquid interfaces in binary alloys has been developed, and
is based on the generalised kinetic equation and phase-field technique for crystal growth. The migration rate of the
solid–liquid interface is expressed as a function of diffusivity, interfacial energy, temperature, solute concentration,
molar volume, free energy and chemical potentials. Each quantity in the expression is either available from handbooks
or can be computed using a thermodynamic database. Numerical calculations based on the present theory for the
solidification of Al–Si, Al–Cu and Al–Mg binary alloys have been performed. Data fitting by the KGT model,
v ? ADTn; reveals that 0:7ono1: The results agree well with prior metallurgical knowledge.
r 2003 Elsevier Science B.V. All rights reserved.
PACS: 81.10.Aj; 68.45.v; 64.70.Dv
Keywords: A1. Growth models; A2. Growth from melt; B1. Alloys
1. Introduction
Phase-field models based on the time-dependent
Ginzburg–Landau theory are used to reproduce
many solidification microstructures that can be
observed experimentally [1,2]. Hence such models
have the potential to predict accurately solidifica-
tion in real alloy systems. Many of the necessary
relationships between the various parameters in
the governing equations of the phase-field model
and classical thermodynamic quantities have been
established [3–5]. Among these parameters is
phase-field mobility which is concerned with the
propagation rates of planar interfaces [3]. How-
ever, relatively little is known about the propaga-
tion rates of planar interfaces in alloys even
though more comple
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