DS_TC293B1xxx-TUVZ(Preliminary).pdf

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DS_TC293B1xxx-TUVZ(Preliminary)

TC293B1xxx – TUVZ Series Cooled DFB Laser Diode Jan. 2013 For additional information, visit it our website at 1 TC293B1xxx – TUVZ Series Cooled DFB Laser Diode Description The TC293B1xxx – Series cooled DFB laser diode is a hermetically sealed device with a photo diode for optical output monitoring. It incorporates single mode edge- emitting laser diode chip and a micro-TEC for use in cooled applications up to 3.125Gb/s. The laser is mounted into a TO header and is hermetically sealed with a specific cap. Preliminary Data Sheet Jan. 2013 Features Data rates up to 3.125Gb/s Temperature stabilized Very low TEC power consumption 25Ω single-ended data input Case operating temperature range: -40 to 85C Applications Cooled DML TO-can for wavelength controllable TC293B1xxx – TUVZ Series Cooled DFB Laser Diode Jan. 2013 For additional information, visit it our website at 2 Absolute Maximum Ratings Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are absolute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings will cause permanent damage and/or adversely affect device reliability. (*) Local heating only Electrostatic Discharge CAUTION: This device is susceptible to damage as a result of electrostatic discharge. Take proper precautions during both handling and testing. Follow guidelines such as JEDEC Publication No. 108- A(Dec. 1988) CyOptics employs a human-body model(HBM) for ESD-susceptibility testing and protection-design evaluation. ESD voltage thresholds are dependent on the critical parameters used to define the model. A standard HBM(resistance = 1.5kΩ, capacitance = 100 pF) is widely used and can be used for comparison purposes.

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