电子显微镜研究方法Question.ppt

Questions V: Q1 Name the three principal components of the TEM. Q2 How do you form a parallel beam; why would you want to do this and why is it not exactly parallel? Q3 What is SAED and how is it different from CBED? Q4 What is the most important aperture in the TEM and why? Q5 How do you change the image magnification in a TEM? Questions VI: Questions VII: * Questions Ⅰ: Q1. What is the resolution or the resolving power of a microscope? Q2. What limits the resolution of VLMs? Q3. What limits the resolution of TEMs? Q4. How can we get high resolution in a TEM? Q5. Explain why sampling is a problem with TEMs and how to combat this limitation. Q6. What is the major difficulty with interpreting all TEM images? Q7. What are the typical causes of specimen damage in the TEM? Questions Ⅱ: Q1.What effect should we consider in any calculations when the energy of the electrons is 100 keV or higher and why? Q2. How do you focus an image in a TEM? Q3.To achieve the highest magnification, where should the specimen be located relative to the objective lens? Q4. Define ‘underfocused’ and ‘overfocused.’ Q5. Why is the objective lens the most important lens in a TEM? Questions Ⅲ: Q1 Why do we use apertures in the TEM? Q2 What causes spherical aberration and how can we minimize it? Q3 Define chromatic aberration and describe how to minimize it. Q4 What causes astigmatism and how do we correct it? Q5 What ultimately limits the TEM resolution? Q6 Estimate the limit of resolution in a 100-kV TEM if the specimen is very thin. Assume Cs=1mm and β=10 mrads. Questions Ⅳ: Q1 ‘Characteristic’ X-rays are characteristic of what? Q2 What is the critical ionization energy? Q3 What controls the energy and wavelength of the characteristic X-ray? Q1 What causes mass-thickness contrast? Q2 What influences the intensity of mass-thickness contrast? Q3 For what materials is mass-thickness contrast most useful? Q4 What microscope controls can affect the mass-thickness contr