基于SPI的三维物体变形测试.pdfVIP

Vol.35 No.1 第35 卷第1 期 长春理工大学学报(自然科学版} 2012 年3 月 loun田lofα回鸣:chun Univ町sity of Science and T，田hnology (Natural Scien出Editionl Mar.2012 基于SPI 的三维物体变形测试 黄芳，张文静，王文生 (长春理工大学光电工程学院，长春 13∞122) 摘 要:本文在SPI测量变形物体三维位相的原理上，选用马赫一泽德干涉系统，提出了用一个干涉图法，实现了散斑干涉 囤三维位相测试的新方法。用CCD分别接收物体变形前后的散斑图，将两幅散斑图相减得到变形物体的散班干涉条纹圈。 应用 MAT LAB软件编程对散斑千涉图进行二维FFT运算，获得变形物体的三维位相。由三维位相分布可以判读物体的 三维变形，进而为后续分析物体的三维应力奠定基础。实验表明，该方法简单、速度快，一个干涉圈法可减少震动对测试 结果的影响，精度容易达到.l./10。 关键词:散斑干涉术;马赫一泽德系统;散斑干涉条纹;一个干涉图法 中图分类号: TN29 文献标识码:A 文章编号: 1672-9870 (2012) 01-{刀49-û4 3D-Defonnation Object Testing Base on Speckle Pattern. Interferometry HUANG Fang. ZHANG Wenjing , WANG Wensheng (Dep缸tment of opt倪忧troniωengineering， Changchun University of Science and Technology , Changchun 13∞22) Abstract: ßased on the principle of measuring defonnation 0均ect 3D phase with SPI. choωing Mach-Zehnder interfer- ence system. one st叩 interference pattem metl时 is propos时， me笛田ing 3D phase of speckle interferograms is real- ized. Using CCD receiving the speckle 阴阳m of object before and after deformati∞. the 取ckle pattem int臼ference figure of a deformation obj回 can be go忧en by two 部eckle pattern subtractions. Applying 抽 MATLAB software pro- gramm吨 S严ckle pattern interference figt配 IS 如t F ourier transformed，由m 配 3D phase of a defonnati∞ o均创 IS obtained. From 3D phase distribution , 3D object deformation can be judged , and more 配 f町由er foundation of 扭 曲-ess analysis of an object is laid.ηle e耳eriment results show 也就 the me出od is simply. 也st. and can reduce the effect of vibration on test吨， the precision can easy reach up to À /10. Key words: SPI; Mach-Zehnder system;ψeckle pattern interference 创吨臼; one