非接触IC卡芯片的低成本测试（国外英文资料）.docVIP

非接触IC卡芯片的低成本测试（国外英文资料） The information that is worth having It comes from the general learning accumulation summary There must be a problem Please be critical! Low cost testing for non-contact IC card chips Edwan test (suzhou co., LTD) Shanghai branch, liu Yang Abstract: with the continuous maturity of RFID technology and specification Our countrys second-generation id card is starting to use RFID based non-contact IC card chips Test questions for design validation and mass production This paper introduces a solution for low cost testing of IC card chips The standard test method requires that the IC tester (ATE) have a more expensive hybrid signal test component to transmit/identify RP signals The solution only requires that ATE has a general digital circuit test function Combine RFID application modules All tests on the required chip requirements can be achieved by ensuring the accuracy and stability of the test The biggest advantage of this is that it greatly reduces the cost of hardware for the ATE itself The test time is short And it has great flexibility Non-contact IC card type and international standard According to the distance between the card reader and the IC card You can split the non-contact IC card into the following four classes (see figure 1-1) The second generation id card USES close-range communication The non-contact IC card that meets IS014443 Its effective range is about 10-15cm The typical working frequency is 13.56 MHz ISO14443 and contains A B C three types (of which C undetermined) Table 1-1 compares the type A and B from the card reader to the IC card and IC card to the card reader The second generation card USES a type B non-contact IC card chip The card reader sends a carrier frequency of 13.56 MHz + / -7khz Use 10% of the ASKs modulation And NRZ (not zero) The data transfer rate is 106/212Kbps; The return signal of the card chip is adopted by BPSKs subcarrier modulation The subcarrier frequency is 847KHz Figure 1-2 is the comparison of