上衣各部位称和常用的量度文法.doc

可靠性光盘的目录 CD1 //Application Notes for Solid Tantalum Capacitors //Capacitor Lifetime Calculation 200302 //LIFETME CALCULATION FORMULA OF ALUMINUM ELECTROLYTIC CAPACITORS //Guide to Use Aluminum Electrolytic Capacitors //Aluminium Electrolytic Capacitors //ELECTRICAL CHARACTERISTICS AND EXPLANATION OF TERMS //电解电容的应用 //电容寿命计算方法： //電容衝擊試驗報告 //電容衝擊試驗報告 //壽命計算公式-max //A11空调系统失效模式分析 //FMEA(sumida) //FMEA //FMEA手册 //PFMEA案例 //系统FMEA //Accelerated Thermal Cycling and Failure Mechanisms //Accelerated_Standards_Transition_Plan_Approved_by_Board_06_04 //Accelerated stress testing //the enviromental stress screen handbook //Pre halt analysis //谈加速寿命试验 //2003 CARTS Derating differences Ta-KO-AO //sony ss-00259 handbook //ADI Reliability Handbook //stress test qualification for discrete semiconductors //An Overview of Weibull Analysis //balloons reliability analysis //An Improved SPICE Capacitor Model //CONSEQUENCES AND CATEGORIES OF SRAM FPGA //COST ANALYSIS //EEE PARTS DERATING //Stochastic Aging and Dependence for Reliability //Fault tree construction //final drive and axle fluid requirements //Fish Embryo Analysis //FLOTHERM V4.1 Introductory //Generalized Step Stress Accelerated Life Model //HALT HASS //IBM ASIC Products Application Note //IEC 60950 //Improving the Performance of Your Root Cause Analysis (RCA) Program //The Application of Accelerated Testing Methods and Theory Accelerated Testing Methods and Theory HALT-HASS //Life Testing and Reliability Predictions for Electromechanical Relays //MAXIM reliability report //TESTING FOR RELIABILITY IN SPACE SYSTEMS //MTBF Instruction Guide //MTBF 計算方法概論 //MODELING AND SIMULATION OF RELIABILITY MAINTAINABILITY PARAMETERS FOR REUSABLE LAUNCH VEHICLES USING DESIGN OF EXPERIMENTS //on precendence life testing //MEASUREMENT PRACTICES FOR RELIABILITY AND POWER QUALITY //POST PROGRAMMING BURN IN (PPBI) FOR RT54SX-S AND A54SX-A ACTEL FPGAS //Profile_PAL_draft_v1_3b //MINI DIN Series Connector Product Specification (For Internal