ScannigElectronicMicroscop扫描电子显微镜原理.pptxVIP

Scanning Electronic Microscope; Scanning electronic microscope (SEM) is an instrument used to magnify the fine details of material surfaces such as polymer splitting, polymer pull-out, debonding, matrix cracking and polymer matrix adhesion and determine its chemical composition. It is also used to check the morphology, and crystallization structure. Scanning electronic microscopy consists of: Electron gun Condenser lens Scan coil Objective lens Specimen and detector ; ;Principle of SEM ;Sample preparation Degrease sample using acetone- to ensure removal of hydrocarbon and volatile