1818 IEEE TRANSACTIONS ON CIRCUITS AND (1818年IEEE电路和).pdf

1818 IEEE TRANSACTIONS ON CIRCUITS AND (1818年IEEE电路和).pdf

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1818 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: REGULAR PAPERS, VOL. 56, NO. 8, AUGUST 2009 Strong Injection Locking in Low- LC Oscillators: Modeling and Application in a Forwarded-Clock I/O Receiver Sudip Shekhar, Student Member, IEEE, Mozhgan Mansuri, Member, IEEE, Frank O’Mahony, Member, IEEE, Ganesh Balamurugan, Member, IEEE, James E. Jaussi, Member, IEEE, Joseph Kennedy, Member, IEEE, David J. Allstot, Fellow, IEEE, Randy Mooney, Member, IEEE, and Bryan Casper, Member, IEEE Abstract—A general model for injection-locked LC oscillators (LC-ILOs) is presented that is valid for any tank quality factor and injection strength. Important properties of an ILO such as lock-range, phase shift, bandwidth and response to input jitter are described. An LC-ILO together with a half-rate data sampler is implemented as a forwarded-clock I/O receiver in 45-nm CMOS. A strongly-injected low- LC oscillator enables clock deskew across 1UI and rejects high-frequency clock jitter. The complete 27 Gb/s ILO-based data receiver has an overall power efficiency Fig. 1. Injecting an oscillator with an external clock. of 1.6 mW/Gb/s. Index Terms—Clocks, high-speed input/output (I/O), jitter, re- ceivers, voltage-controlled oscillator (VCO). when other tank losses are also taken into consideration. Prior analysis of LC-ILOs modeled the tank as an equivalent parallel RLC network. However, for the range of inductor quality factor I. INTRODUCTION

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