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40 4 523
40 4 Vol. 40No. 4
2 0 1 2 4 JOURNAL OF THE CHINESE CERAMIC SOCIETY April 2012
ZnO
1 2 3
(1. 430074 2. 430074 3.
526020)
(ESEM)X (XRD)X (EDXS)ZnO
ESEM 60 MPa Ag Ag 900
EDXS XRD 900 Ag Ag
Ag Ag 900 ZnO
V1mA = 6.1 Vα= 28.1IL = 0.15 μA
TN304 TB34 A 0454–5648(2012)04–0523–06
2012–03–31 11:18:00 DOI CNKI:11-2310/TQ1118.010
/kcms/detail/11.2310.TQ1118.010.html
Low-Temperature Co-Firing Preparation and Properties of ZnO Chip Varistor by
Aqueous Tape Casting
WAN Shuai1 2 3
LÜ Wenzhong FU Zhenxiao
(1. State Grid Electric Power Research Institute, Wuhan 430074, China; 2. Department of Electronic Science and Technology,
Huazhong University of Science and Technology, Wuhan 430074, China; 3. Fenghua Advanced Technology Holding
Co., Ltd, Zhaoqing 526020, Guangzhou, China)
Abstract: Effect of low-temperature co-firing preparation on the microstructure and electrical properties of ZnO chip varistor pre-
pared using an aqueous tape casting was investigated by environmental scanning electron microscopy (ESEM), X-ray diffraction
(XRD) and energy dispersive X-ray spectroscopy (EDXS). The ESEM results show that ZnO varistor sheets and Ag pastes contact
with each other compactly under an isostatic pressures of
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