Surface Roughness Statistical Analysis Using 3D （使用3 d表面粗糙度统计分析）.pdfVIP

SURFACE ROUGHNESS STATISTICAL ANALYSIS USING 3D PROFILOMETRY Prepared by Jorge Ramirez 6 Morgan, Ste156, Irvine CA 92618 路 P: 949.461.9292 路 F: 949.461.9232 路 Todays standard for tomorrows materials. 漏 2012 NANOVEA INTRODUCTION: With constant development of new materials and processes, it is often a challenge to find credible ways to properly assess material surfaces for quality control. Manufacturers have had to find or develop new ways to make sure that materials are in compliance to specific internal or external manufacturing standards. The Nanovea Profilometer can do much more than that. It can meet and exceed expectations by developing new standards, DOE鈥檚, survey sampling, predictions and forecasting鈥檚. IMPORTANCE OF 3D NON CONTACT PROFILOMETER FOR STATISTICAL ANALYSIS Nanovea鈥檚 3D non-contact profilometer is capable of measuring the widest range of surfaces to assess roughness, planarity and many others. Surface roughness at the micron level can often be challenging to assess for manufactures and is vital when asked to develop new standards or DOE鈥檚. Nanovea鈥檚 3D non-contact profilometer can provide a real value to measurements produced and test the probability of observations unlike theoretical statistics where the data is portrayed. MEASUREMENT OBJECTIVE In this application the Nanovea ST400 Profilometer is used to measure over 30 coupons with similar surface features with only slight differences. The surfaces were analyzed for parameters such as surface roughness, maximum height, maximum peak height and root mean square. A statistical analysis was then performed using histograms, tables, control charts, box plots and scatter plots.